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Model for nanopillar growth by focused helium ion-beam-induced deposition

机译:聚焦氦离子束诱导沉积的纳米柱生长模型

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摘要

An analytical model for the growth of nanopillars by helium ion-beam-induced deposition is presented and compared to experimental data. This model describes the competition between pillar growth in vertical and lateral directions. It assumes that vertical growth is induced by incident primary ions and type-1 secondary electrons, whereas lateral growth is induced by scattered ions and type-2 secondary ions. An essential element of the model is the notion that depletion of adsorbed precursor molecules occurs only at the pillars’ apex. Depletion impedes vertical growth at the apex, allowing more time for lateral outgrowth of the pillar’s sidewalls. The model describes qualitatively the trends in measured vertical, lateral, and volumetric growth rates of PtC pillars as functions of the ion-beam current. It can be used to design growth experiments and Monte Carlo simulations.
机译:提出了氦离子束诱导沉积生长纳米柱的分析模型,并与实验数据进行了比较。该模型描述了支柱在垂直和横向方向上的竞争。假定垂直生长是由入射的初级离子和1型二次电子诱导的,而横向生长是由散射离子和2型二次离子诱导的。该模型的基本要素是这样的概念,即吸附的前体分子的耗竭仅发生在支柱的顶点。耗尽会阻碍顶点的垂直生长,从而为柱子侧壁的横向向外扩展留出更多时间。该模型定性地描述了PtC支柱的垂直,横向和体积生长速率的测量趋势,该趋势是离子束电流的函数。它可以用于设计生长实验和蒙特卡洛模拟。

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